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JP
Accelerate new challenges
Wafer surface particle scanner
Glass substrate inspection system
About YGK
Bringing new inspection value to the semiconductor market
Accelerate new challenges
Accelerate new challenges
NEWS
We’ve obtained ISO9001 certification.
Thank you for visiting our booth at Semicon Japan 2024.
Our website has been renewed
News List
Products
Glass substrate inspection system
XGS
Wafer surface particle scanner
YPI-MX
Wafer surface particle scanner
YPI-MX（semi-automatic）
Wafer surface particle scanner
YPI-MX FOUP
Wafer surface particle scanner
YPI-MN（semi-automatic）
Dicing (Tape frame) Wafer Surface Inspection System
YPI-MX TF
Tape frame wafer surface particle scanner
YPI-MX TF FOUP
Products
YGK CORPORATION
595-2, Kuruwada, Minami-Alps city, Yamanashi, 400-0311Japan.
+81-55-284-6866
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